Electrochemical migration and flux residues. Causes and detection

National Electronic Packaging and Production Conference-Proceedings of the Technical Program (West and East)

Volumn 1, Issue , 1992, Pages 386-393

  Brous, Jack ^a  

^a Alpha Metals Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IONS - TRANSPORT PROPERTIES; LAMINATED PRODUCTS - MOISTURE;

ELECTROCHEMICAL MIGRATION; ELECTRONIC ASSEMBLIES; FLUXES; HUMIDITY EFFECTS;

PRINTED CIRCUITS;

EID: 0026759111     PISSN: 04700155     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)