Can digital GaAs be used in a space environment? A look at single event upset in GaAs

Technical Digest - GaAs IC Symposium (Gallium Arsenide Integrated Circuit)

Volumn , Issue , 1992, Pages 79-82

  Weatherford, T R ^a   Campbell, A B ^a   McMorrow, D ^a   Langworthy, J B ^a   Stapor, W J ^a   Knudson, A R ^a   Petersen, E L ^a   Wilson, D ^a   Tran, L ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL DEVICES; INTEGRATED CIRCUITS; REDUNDANCY; SEMICONDUCTING GALLIUM ARSENIDE;

SINGLE EVENT UPSET;

TRANSISTORS, FIELD EFFECT;

EID: 0026743704     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)