Mechanisms of ionizing-radiation-induced degradation in modern bipolar devices

Proceedings of the 1991 Bipolar Circuits and Technology Meeting

Volumn , Issue , 1992, Pages 174-177

  Nowlin, R N ^a   Schrimpf, R D ^a   Enlow, E W ^a   Combs, W E ^a   Pease, R L ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; HOT CARRIERS; IONIZATION; SEMICONDUCTOR DEVICES, BIPOLAR--DEGRADATION; SEMICONDUCTOR MATERIALS--CHARGE CARRIERS;

DEPLETION LAYERS; IONIZING-RADIATION-INDUCED DEGRADATION; POLYEMITTERS;

TRANSISTORS, BIPOLAR;

EID: 0026743492     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)