Delay testing of digital circuits by output waveform analysis

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 798-807

  Franco, Piero ^a   McCluskey, Edward J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL CIRCUITS; LOGIC CIRCUITS; SAMPLING; WAVEFORM ANALYSIS;

DELAY FAULT TESTING; FAULT FREE CIRCUITS;

ELECTRON DEVICE TESTING;

EID: 0026732531     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (27)