Characterization of Shielded Coplanar Type Transmission Line Junction Discontinuities Incorporating the Finite Metallization Thickness Effect

IEEE Transactions on Microwave Theory and Techniques

Volumn 40, Issue 1, 1992, Pages 73-80

  Kuo, Chih Wen ^a   Itoh, Tatsuo ^b  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSTRIP DEVICES; MICROWAVE DEVICES;

COPLANAR WAVEGUIDES; FINITE METALLIZATION THICKNESS EFFECT; MODE MATCHING TECHNIQUES; SHIELDED COPLANAR TYPE TRANSMISSION LINE JUNCTIONS; SHIELDED JUNCTION DISCONTINUITIES;

WAVEGUIDE COMPONENTS;

EID: 0026727393     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.108325     Document Type: Article

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