An accurate bridging fault test pattern generator

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 411-418

  Millman, Steven D ^a   Garvey, James P ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; CMOS INTEGRATED CIRCUITS; VLSI CIRCUITS;

BENCH MARK CIRCUITS; FAULT TEST PATTERN GENERATION; FEEDBACK BRIDGING FAULTS;

INTEGRATED CIRCUIT TESTING;

EID: 0026718075     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)