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Volumn , Issue , 1992, Pages 906-915
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Logic partitioning and resynthesis for testability
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
LOGIC CIRCUITS;
PROBABILITY;
SIGNAL PROCESSING;
LOGIC PARTITIONING;
ELECTRON DEVICE TESTING;
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EID: 0026716901
PISSN: 07431686
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (2)
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References (20)
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