Fault location with current monitoring

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 623-632

  Aitken, Robert C ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; MONITORING;

DIVA METHOD; FAULT LOCATION;

INTEGRATED CIRCUIT TESTING;

EID: 0026716871     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)