A Unified Framework for Simulating Markovian Models of Highly Dependable Systems

IEEE Transactions on Computers

Volumn 41, Issue 1, 1992, Pages 36-51

  Shahabuddin, Perwez ^b   Glyni, Peter W ^b   Nicola, Victor F ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

Dependability measures; highly available systems; importance sampling; Markovian models; rare event simulation; variance reduction

Indexed keywords

MATHEMATICAL STATISTICS--MONTE CARLO METHODS;

MARKOVIAN MODELS;

COMPUTER SIMULATION;

EID: 0026707014     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.123381     Document Type: Article

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