Delay testing quality in timing-optimized designs

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 897-905

  Park, Eun Sei ^a   Underwood, Bill ^a   Williams, T W ^a   Mercer, M Ray ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; DELAY CIRCUITS; OPTIMIZATION; TIMING CIRCUITS;

DELTA FUNCTION; PATH DELAYS;

ELECTRON DEVICE TESTING;

EID: 0026677927     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)