Fault modeling for the testing of mixed integrated circuits

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 564-572

  Meixner, Anne ^a   Maly, Wojciech ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DIGITAL CIRCUITS; OPERATIONAL AMPLIFIERS;

ANALOG FAULT MODELS; FAULT MODELLING;

INTEGRATED CIRCUIT TESTING;

EID: 0026676973     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (24)