Hierarchical test generation based on delayed propagation

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 739-747

  Karam, M ^a   Leveugle, R ^a   Saucier, G ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DIGITAL CIRCUITS;

DATA PATHS; HIERARCHICAL TEST GENERATION; SYNCHRONIOUS CIRCUITS;

ELECTRON DEVICE TESTING;

EID: 0026676971     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)