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Volumn 7, Issue 6, 1992, Pages 221-269

Interactions between binary metallic alloys and Si, GeSi and GaAs

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM--SILICON ALLOYS; INTERMETALLICS; MATERIALS SCIENCE; METALLIC FILMS--THIN FILMS; SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0026642791     PISSN: 09202307     EISSN: None     Source Type: Journal    
DOI: 10.1016/0920-2307(92)90009-P     Document Type: Review
Times cited : (15)

References (175)
  • 96
    • 85062142111 scopus 로고
    • International Center for Diffraction Data, Pennsylvania, Compiled by the Committee on Powder Diffraction Standards
    • (1984) X-ray Powder Data File
  • 105
    • 85062142059 scopus 로고    scopus 로고
    • L.-S. Hung, to be published.
  • 119
    • 84913977309 scopus 로고
    • A Comparative Study of Thin-Film and Bulk Reaction Kinetics and Diffusion Path: the Ir/GaAs System
    • (1989) MRS Proceedings , vol.144 , pp. 557
    • Schulz1    Chang2
  • 148
    • 85062135612 scopus 로고    scopus 로고
    • L.-S. Hung, unpublished data.
  • 166
    • 0009509585 scopus 로고
    • Initial Phase Formation and Distribution in the Pt-GexSi1−x and Cr-GexSi1−x Systems
    • (1990) MRS Proceedings , vol.181 , pp. 145
    • Hong1    Mayer2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.