Two-pattern test capabilities of autonomous TPG circuits

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 704-711

  Furuya, Kiyoshi ^a   McCluskey, Edward J ^a  

^a CHUO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; CMOS INTEGRATED CIRCUITS; MATRIX ALGEBRA;

BUILT IN SELF TESTING; TEST PATTERN GENERATORS;

INTEGRATED CIRCUIT TESTING;

EID: 0026618765     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)