Concurrent error detection for restricted fault sets in sequential circuits and microprogrammed control units using convolutional codes

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 926-935

  Holmquist, Lawrence P ^a   Kinney, L L ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR DETECTION; MICROPROGRAMMING; SEQUENTIAL CIRCUITS;

CONCURRENT ERROR DETECTION; CONVOLUTIONAL CODES;

ELECTRON DEVICE TESTING;

EID: 0026618762     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)