Current vs. logic testing of gate oxide short, floating gate and bridging failures in CMOS

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 510-519

  Rodriguez Montanes, R ^a   Segura, J A ^a   Champac, V H ^a   Figueras, J ^a   Rubio, J A ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DEFECTS; LOGIC CIRCUITS; LOGIC GATES;

BRIDGING FAILURES; GATE OXIDE SHORTS; SOFTWARE PACKAGE SPICE;

INTEGRATED CIRCUIT TESTING;

EID: 0026618711     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)