Allocation and assignment in high-level synthesis for self-testable data paths

Digest of Papers - International Test Conference

Volumn , Issue , 1992, Pages 463-472

  Avra, LaNae ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; DATA PROCESSING;

PSEUDO-RANDOM PATTERN GENERATORS; SELF TESTABLE DATA PATHS;

ELECTRON DEVICE TESTING;

EID: 0026618697     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (28)