Convergent-beam electron diffraction in the high-voltage electron microscope with continuously variable reference voltage for lenses and alignments

Ultramicroscopy

Volumn 39, Issue 1-4, 1991, Pages 58-64

  Kuroda, K ^a   Morita, C ^a   Arai, S ^a   Yokoi, N ^a   Saka, H ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL EQUIPMENT, ELECTRIC; ELECTRONS - DIFFRACTION; MICROSCOPES, ELECTRON - CONTROL; SUPERCONDUCTING MATERIALS - MICROSCOPIC EXAMINATION;

ALIGNMENTS; CONTINUOUSLY VARIABLE REFERENCE VOLTAGE; CONVERGENT BEAM ELECTRON DIFFRACTION; ELECTRICAL DEVICE; HIGH VOLTAGE ELECTRON MICROSCOPES;

MICROSCOPES, ELECTRON;

CONFERENCE PAPER; ELECTRON MICROSCOPE; ELECTRON MICROSCOPY; INSTRUMENTATION;

EID: 0026414302     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(91)90182-6     Document Type: Article

References (0)