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Applied Surface Science

Volumn 50, Issue 1-4, 1991, Pages 79-86

Raman spectroscopy for impurity characterization in III-V semiconductors

(1) Wagner, Joachim a

a FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

PHONONS; SEMICONDUCTING GALLIUM ARSENIDE - IMPURITIES; SPECTROSCOPIC ANALYSIS; SPECTROSCOPY, RAMAN;

PHONON SCATTERING;

SEMICONDUCTOR MATERIALS;

EID: 0026413823 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/0169-4332(91)90142-7 Document Type: Article

Times cited : (9)

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2
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3
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4
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15
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17
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18
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25
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26
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27
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28
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29
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30
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31
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- Wagner¹ Wettling² Windscheif³ Rothemund⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.