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Volumn 14, Issue 4, 1991, Pages 824-832

Thermal Cycling Induced Plastic Deformation in Solder Joints — Part II: Accumulated Deformation in Through Hole Joints

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY AND ALLOYS--APPLICATIONS; ELECTRONICS PACKAGING--MATHEMATICAL MODELS; ELECTRONICS PACKAGING--SOLDERING; LEAD AND ALLOYS--APPLICATIONS; MATHEMATICAL TECHNIQUES--FINITE ELEMENT METHOD;

EID: 0026398794     PISSN: 01486411     EISSN: None     Source Type: Journal    
DOI: 10.1109/33.105140     Document Type: Article
Times cited : (25)

References (16)
  • 1
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    • Thermal cycling induced plastic deformation in solder joints, Part I: Accumulated deformation in surface mount joints
    • Mar. also T.-Y. Pan and W. L. Winterbottom, “Thermal cycling induced plastic deformation in solder joints,” presented at ASME Winter Ann. Meeting, Dallas, TX, Nov. 25–30, 1990
    • T.-Y. Pan, “Thermal cycling induced plastic deformation in solder joints, Part I: Accumulated deformation in surface mount joints,” ASME Trans. J. Electron. Pack., vol. 113, no. 1, pp. 8–15, Mar. 1991; also T.-Y. Pan and W. L. Winterbottom, “Thermal cycling induced plastic deformation in solder joints,” presented at ASME Winter Ann. Meeting, Dallas, TX, Nov. 25–30, 1990.
    • (1991) ASME Trans. J. Electron. Pack. , vol.113 , Issue.1 , pp. 8-15
    • Pan, T.-Y.1
  • 2
    • 0016648217 scopus 로고
    • The influence of several design and material variables of the propensity for solder joint cracking
    • J. W. Munford, “The influence of several design and material variables of the propensity for solder joint cracking,” IEEE Trans. Parts, Hybrids, Pack., vol. PHP-11, pp. 296–304, 1975.
    • (1975) IEEE Trans. Parts, Hybrids, Pack. , vol.PHP-11 , pp. 296-304
    • Munford, J.W.1
  • 3
    • 0014906693 scopus 로고
    • Calculation of thermally induced mechanical stresses in encapsulated assemblies
    • E. Baker, “Calculation of thermally induced mechanical stresses in encapsulated assemblies,” IEEE Trans. Parts, Mat., Pack., vol. PMP-6, pp. 121–128, 1970.
    • (1970) IEEE Trans. Parts, Mat., Pack. , vol.PMP-6 , pp. 121-128
    • Baker, E.1
  • 4
    • 0019697089 scopus 로고
    • Mechanisms of temperature cycle failure in encapsulated optoelectronic devices
    • J. Uebbing, “Mechanisms of temperature cycle failure in encapsulated optoelectronic devices,” in 19th Ann. Proc. of Reliability Physics, 1981, pp. 149–156.
    • (1981) 19th Ann. Proc. of Reliability Physics , pp. 149-156
    • Uebbing, J.1
  • 6
    • 84939380574 scopus 로고
    • Characterization of solder fatigue in electronic packaging
    • Feb. 17–19
    • J. L. Marshall, “Characterization of solder fatigue in electronic packaging,” in 12th Ann. Electronics Manufacturing Seminar Proc., Feb. 17–19, 1988, pp. 389–411.
    • (1988) 12th Ann. Electronics Manufacturing Seminar Proc. , pp. 389-411
    • Marshall, J.L.1
  • 7
    • 84939329720 scopus 로고
    • Ford Technical Report, SR-88-78, Sept. SR-89-71, June 1989
    • R. Govila, Ford Technical Report, SR-88-78, Sept. 1988; SR-89-71, June 1989.
    • (1988)
    • Govila, R.1
  • 9
    • 84910174686 scopus 로고
    • Analytical and experimental study of thermal ratchetting
    • American Society for Testing and Materials
    • A. V. A. Swaroop and A. J. McEvily, Jr., “Analytical and experimental study of thermal ratchetting,” Fatigue at Elevated Temperatures, American Society for Testing and Materials, 1973, pp. 563–572.
    • (1973) Fatigue at Elevated Temperatures , pp. 563-572
    • Swaroop, A.V.A.1    McEvily, A.J.2
  • 10
    • 0003517810 scopus 로고
    • Thermal fatigue of solder joints in micro-electronic devices
    • Aug.
    • P. J. Adams, “Thermal fatigue of solder joints in micro-electronic devices,” M.S. thesis, MIT, Aug. 1986.
    • (1986) M.S. thesis, MIT
    • Adams, P.J.1
  • 11
    • 0018479455 scopus 로고
    • Stress relaxation in tin-lead solders
    • E. Baker, “Stress relaxation in tin-lead solders,” Mat. Sci. Eng., vol. 38, pp. 241–247, 1979.
    • (1979) Mat. Sci. Eng. , vol.38 , pp. 241-247
    • Baker, E.1
  • 12
    • 0001723415 scopus 로고
    • Experimental constitutive relations for the high temperature deformation of a Pb-Sn eutectic alloy
    • B. P. Kashyap and G. S. Murty, “Experimental constitutive relations for the high temperature deformation of a Pb-Sn eutectic alloy,” Mat. Sci. Eng., vol. 50, pp. 205–213, 1981.
    • (1981) Mat. Sci. Eng. , vol.50 , pp. 205-213
    • Kashyap, B.P.1    Murty, G.S.2
  • 13
    • 5844398851 scopus 로고
    • Package reliability
    • R. R. Tummala and E. J. Rymaszewski, eds. New York: Van Nostrand Reinhold
    • D. A. Jeannotte, L. S. Goldmann, and R. T. Howard, “Package reliability,” in Microelectronics Packaging Handbook, R. R. Tummala and E. J. Rymaszewski, eds. New York: Van Nostrand Reinhold, 1989.
    • (1989) Microelectronics Packaging Handbook
    • Jeannotte, D.A.1    Goldmann, L.S.2    Howard, R.T.3
  • 14
    • 84896894404 scopus 로고
    • Surface mount solder joint long-term reliability: Design, testing, prediction
    • Feb.
    • W. Engelmaier, “Surface mount solder joint long-term reliability: Design, testing, prediction,” Soldering Surface Mount Technol., no. 1, pp. 14–22, Feb. 1989.
    • (1989) Soldering Surface Mount Technol. , Issue.1 , pp. 14-22
    • Engelmaier, W.1
  • 15
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    • Integrated matrix creep: Application to lifetime prediction of eutectic tin-lead solder joints
    • Nov.
    • S. Knecht. “Integrated matrix creep: Application to lifetime prediction of eutectic tin-lead solder joints,” in Materials Research Society Symp. Proc., vol. 203, Nov. 1990.
    • (1990) Materials Research Society Symp. Proc. , vol.203
    • Knecht, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.