The on-orbit measurements of single event phenomena by ETS-V spacecraft

IEEE Transactions on Nuclear Science

Volumn 38, Issue 6, 1991, Pages 1693-1699

  Kuboyama, S ^b   Shimano, Y ^b   Kawanishi, T ^b  

^a High Reliability Components Corporation ^*  (Japan)

^b JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SATELLITES--GEOSTATIONARY; STATISTICAL METHODS;

ENGINEERING TEST SATELLITE-V; SINGLE EVENT PHENOMA;

INTEGRATED CIRCUITS, CMOS;

EID: 0026396451     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.124164     Document Type: Article

References (5)

1. W.A.Kolasinski, R.Koga, E.Schunauss, J.Duffy, “The Effect of Evaluated Temperature on Latchup and Bit Errors in CMOS Devices”, IEEE Trans. Nucl. Sci. NS-33, pp1605–1609, 1986
2. E.J. Gumbel, “Statistics of Extremes”, Columbia Univ. Press, New York, 1958
3. H. Adams, Jr NRL Memorandum Report 5901, 1989
4. N.Shiono, Y.Sakagawa, M.Sekiguchi, K.Sato, I.Sugai, T.Hattori, Y.Hirao “Single Event Effects in High Density CMOS SRAMs”, IEEE Trans. Nucl. Sci. NS-33, pp1632–1636, 1986
5. Y.Shimano, T.Goka, S.Kuboyama, K.Kawai, T.Kanai, Y.Takami “The Measurements and the Prediction of Proton Upset”, IEEE Trans. Nucl. Sci. NS-36, pp2344–2348, 1989