Application of defect analysis techniques to achieve continuous quality and productivity improvements

IEEE International Conference on Communications

Volumn 3, Issue , 1991, Pages 1450-1454

  Casey, Brian K ^a   Kaldon, Eleanor M ^a   Sun, Jan L ^a   Watters, John M ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

QUALITY CONTROL;

SOFTWARE DEFECTS; SOFTWARE DEVELOPMENT;

COMPUTER SOFTWARE;

EID: 0026389467     PISSN: 05361486     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)