Post irradiation effects (PIE) in integrated circuits

IEEE Transactions on Nuclear Science

Volumn 38, Issue 6, 1991, Pages 1584-1589

  Shaw, D C ^a   Lowry, L ^a   Barnes, C ^a   Zakharia, M ^a   Agarwal, S ^a   Rax, B ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

METALLIZING; RELAXATION PROCESSES; STRESSES; X-RAYS;

POST IRRADIATION EFFECTS;

INTEGRATED CIRCUITS;

EID: 0026384491     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.124149     Document Type: Article

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