Calculation of Electrooptically Induced Refractive Index Changes of Integrated Optic Devices by the Finite-Element-Method

Journal of Optical Communications

Volumn 12, Issue 4, 1991, Pages 125-129

  Steinberg, S ^a   Guntau, M ^a   Goring R ^a   Karthe, W ^b  

^a Institut für Angewandte Physik ^*

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; ELECTROOPTICAL EFFECTS; INTEGRATED OPTICS; INTEGRATED OPTICS - CALCULATIONS; MODULATORS - OPTICAL PROPERTIES;

FINITE ELEMENT METHOD (FEM);

MATHEMATICAL TECHNIQUES;

EID: 0026382846     PISSN: 01734911     EISSN: 21916322     Source Type: Journal    
DOI: 10.1515/JOC.1991.12.4.125     Document Type: Article

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