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Volumn , Issue , 1991, Pages 205-208
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Micromechanical structures for thin film characterization
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMECHANICAL DEVICES - MICROELECTROMECHANICAL;
SEMICONDUCTING SILICON - CHEMICAL VAPOR DEPOSITION;
VIBRATIONS - ANALYSIS;
LATERAL VIBRATIONS;
LINEAR RESPONSE;
LPCVD POLYCRYSTALLINE SILICON;
MICROMECHANICAL STRUCTURES;
NONLINEAR RESPONSE;
STIFFENING SPRING;
SEMICONDUCTING FILMS;
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EID: 0026382037
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (49)
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References (13)
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