Thermal conductivity of thin films. Measurement and microstructural effects

American Society of Mechanical Engineers, Heat Transfer Division, (Publication) HTD

Volumn 184, Issue , 1991, Pages 21-32

  Lambropoulos, J C ^a   Jacobs, S D ^a   Burns, S J ^a   Shaw Klein, L ^a   Hwang, S S ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MATERIALS - THIN FILMS; THERMAL CONDUCTIVITY - MEASUREMENTS;

CONTINUUM EFFECTS; FILM/INTERFACE/SUBSTRATE COMPOSITE; POROSITY EFFECTS; THERMAL COMPARATOR METHOD; THIN FILM MICROSTRUCTURAL EFFECTS; THIN FILM THERMAL CONDUCTIVITY;

THERMAL CONDUCTIVITY;

EID: 0026377624     PISSN: 02725673     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)