The architecture of the GenTest sequential test generator

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1991, Pages

  Bencivenga, Robert ^a   Chakraborty, Tapan J ^a   Davidson, Scott ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING - COMPUTER APPLICATIONS; LOGIC CIRCUITS, COMBINATORIAL - AUTOMATIC TESTING;

ASIC DESIGN; AUTOMATIC TEST PATTERN GENERATION; COMBINATIONAL CIRCUITS; COMPUTER AIDED TESTING; DESIGN FOR TESTABILITY; SEQUENTIAL CICUITS;

LOGIC CIRCUITS, SEQUENTIAL;

EID: 0026371412     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)