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Volumn , Issue , 1991, Pages 201-204
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Buckling behavior of boron-doped pt silicon diaphragms
a a
a
Meadows IL USA
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Author keywords
[No Author keywords available]
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Indexed keywords
OXIDES;
SEMICONDUCTING SILICON - DOPING;
SENSORS - SILICON SENSORS;
STRESSES - ANALYSIS;
BORON-DOPED SILICON DIAPHRAGMS;
DIAPHRAGM BUCKLING;
SENSORS;
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EID: 0026368425
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (9)
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References (7)
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