|
|
|
Volumn , Issue , 1991, Pages 127-143
|
|
Mechanisms of charged-device electrostatic discharges
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
ELECTRIC DISCHARGES;
SEMICONDUCTOR DEVICE TESTING;
CHARGED-DEVICE MODELS;
ELECTROSTATIC DISCHARGES;
ELECTROSTATICS;
|
|
EID: 0026367933
PISSN: 07395159
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
|
Times cited : (29)
|
|
References (42)
|
