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Volumn , Issue , 1991, Pages
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Experimental studies of metastability behaviors of sub-micron CMOS ASIC flip flops
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ARRAYS;
CHARACTERIZATION;
CMOS INTEGRATED CIRCUITS;
COMPUTER ARCHITECTURE;
COMPUTER HARDWARE;
COMPUTER SOFTWARE;
FLOWCHARTING;
GATES (TRANSISTOR);
INTEGRATED CIRCUIT TESTING;
MATHEMATICAL MODELS;
STABILITY;
APPLICATION SPECIFIC FLIP FLOPS;
CMOS ASIC FLIP FLOPS;
MEAN TIME BETWEEN FAILURES (MTBF);
METASTABILITY BEHAVIORS;
METASTABILITY TEST CIRCUIT;
METASTABILITY THEORY;
SUBMICRON GATE ARRAYS;
FLIP FLOP CIRCUITS;
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EID: 0026303136
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (13)
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References (12)
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