Amdahl chip delay test system

IEEE International Conference on Computer Design - VLSI in Computers and Processors

Volumn , Issue , 1991, Pages 200-205

  Deol, I ^a   Mallipeddi, C ^a   Ramakrishnan, T ^a  

^a Amdahl Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; LOGIC DESIGN; RANDOM ACCESS STORAGE; SEQUENTIAL CIRCUITS;

CHIP DELAY TESTING; DELAY TEST GENERATION; RAMS; SEQUENTIAL LOGIC; TEST GENERATION ALGORITHMS;

INTEGRATED CIRCUIT TESTING;

EID: 0026284879     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)