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Quality and Reliability Engineering International
Volumn 7, Issue 6, 1991, Pages 489-495
The physical basis for the roller‐coaster hazard rate curve for electronics
Author keywords

Bathtub curve; Constant failure rate; Failure mechanism; Freak failures; Hazard rate; Roller coaster curve; Stress screening
Indexed keywords

ELECTRONIC EQUIPMENT--RELIABILITY; ELECTRONIC EQUIPMENT--STRESSES;
EID: 0026261069     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.4680070609     Document Type: Article
Times cited : (33)
References (10)
  • 1
    • 84990692228 scopus 로고
    • ‘Off the bathtub onto the roller‐coaster curve’, Proceedings of the Annual Reliability and Maintainability Symposium
    • (1988)
    • Wong, K.L.1    Lindstrom2
  • 4
    • 84990682490 scopus 로고
    • ‘The reliability of semiconductor devices in the Bell system’, Proceedings of the IEEE
    • (1974)
    • Peck, D.S.1    Zerdt, C.H.2
  • 5
    • 84990662259 scopus 로고
    • ‘Deterministic failure prediction’, Proceedings of the Annual Reliability and Maintainability Symposium
    • (1987)
    • Burkhard, A.H.1
  • 6
    • 84990684845 scopus 로고
    • ‘Probablistic fracture mechanics and fatigue methods: application for structural design and maintenance’, Symposium Record, ASTM Special Technical Publication 798
    • (1983)
    • Bloom, J.M.1    Ekvall, J.C.2
  • 7
    • 84990670552 scopus 로고
    • characteristics of polymer insulator and limitation of electrical discharge in void, Conference Record of the 1985 International Conference on Properties and Applications of Dielectric Materials, China, June
    • (1985) V‐t
    • Sakai, T.1
  • 8
    • 84990670594 scopus 로고
    • private communication on the report, ‘Reliability models which account for design flaws and workaround remedies’
    • (1981)
    • Engleman, J.H.1

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.