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Volumn 26, Issue 11, 1991, Pages 1606-1614

Merged BiCMOS Logic to Extend the CMOS/BiCMOS Performance Crossover Below 2.5-V Supply

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUITS, CMOS--PERFORMANCE;

EID: 0026257211     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.98979     Document Type: Article
Times cited : (16)

References (15)
  • 2
    • 0025635255 scopus 로고
    • Merged complementary BiCMOS for logic applications
    • S. Ogura et al., “Merged complementary BiCMOS for logic applications,” in Symp. VLSI Technology Tech. Dig., 1990, pp. 81–82.
    • (1990) Symp. VLSI Technology Tech. Dig , pp. 81-82
    • Ogura, S.1
  • 5
    • 0025575636 scopus 로고
    • Characterization of speed and stability of BiNMOS gates with a bipolar and PMOSFET merged structure
    • H. Momose et al., “Characterization of speed and stability of BiNMOS gates with a bipolar and PMOSFET merged structure,” in IEDM Tech. Dig., 1990, pp. 231–232.
    • (1990) IEDM Tech. Dig , pp. 231-232
    • Momose, H.1
  • 7
    • 0025450395 scopus 로고
    • Level-shifted and voltage reduced 0.5 μmBiCMOS circuits
    • C. Chen, “Level-shifted and voltage reduced 0.5 μ m BiCMOS circuits,” in ISSCC Dig. Tech. Papers, 1990, pp. 236–237.
    • (1990) ISSCC Dig. Tech. Papers , pp. 236-237
    • Chen, C.1
  • 8
    • 0024876034 scopus 로고
    • A BiCMOS logic gate with positive feedback
    • Y. Nishio et al., “A BiCMOS logic gate with positive feedback,” in ISSCC Dig. Tech. Papers, 1989, pp. 116–117.
    • (1989) ISSCC Dig. Tech. Papers , pp. 116-117
    • Nishio, Y.1
  • 10
    • 0024870445 scopus 로고
    • Future Bi-CMOS technology for scaled supply voltage
    • A. Watanabe, T. Nagano, S. Shukuri, and T. Ikeda, “Future Bi-CMOS technology for scaled supply voltage,” in IEDM Tech. Dig., 1989, pp. 429–432.
    • (1989) IEDM Tech. Dig , pp. 429-432
    • Watanabe, A.1    Nagano, T.2    Shukuri, S.3    Ikeda, T.4
  • 12
    • 0023999331 scopus 로고
    • Analysis and characterization of BiCMOS for high-speed digital logic
    • Apr.
    • E. W. Greeneich and K. L. McLaughlin, “Analysis and characterization of BiCMOS for high-speed digital logic,” IEEE J. Solid-State Circuits, vol. 23, pp. 558–565, Apr. 1988.
    • (1988) IEEE J. Solid-State Circuits , vol.23 , pp. 558-565
    • Greeneich, E.W.1    Mclaughlin, K.L.2
  • 13
    • 0024611584 scopus 로고
    • Influence of device parameters on the switching speed of BiCMOS buffers
    • Feb.
    • G. P. Rosseel and R. W. Dutton, “Influence of device parameters on the switching speed of BiCMOS buffers,” IEEE J. Solid-State Circuits, vol. 24, pp. 90–99, Feb. 1989.
    • (1989) IEEE J. Solid-State Circuits , vol.24 , pp. 90-99
    • Rosseel, G.P.1    Dutton, R.W.2
  • 14
    • 84933459323 scopus 로고
    • BiCMOS technology overview
    • Stanford, CA, Stanford BiCMOS Project Tech. Rep., Sept.
    • J. Shott, C. Knorr, and M. Prisbe, “BiCMOS technology overview,” Center for Integrated Systems, Stanford, CA, Stanford BiCMOS Project Tech. Rep., Sept. 1990.
    • (1990) Center for Integrated Systems
    • Shott, J.1    Knorr, C.2    Prisbe, M.3
  • 15
    • 0024919810 scopus 로고
    • A new BiCMOS/CMOS gate comparison/design methodology and supply voltage scaling model
    • P. Raje, K. Saraswat, and K. Cham, “A new BiCMOS/CMOS gate comparison/design methodology and supply voltage scaling model,” in IEDM Tech. Dig., 1989, pp. 433–436.
    • (1989) IEDM Tech. Dig , pp. 433-436
    • Raje, P.1    Saraswat, K.2    Cham, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.