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Surface and Interface Analysis

Volumn 17, Issue 11, 1991, Pages 767-772

Characterization of a thin copper film to investigate microbial biofilm formation

(5) Bremer, Philip J a Geesey, Gill G a Drake, Barney b Jolley, John G c Hankins, Michael R c

a MONTANA STATE UNIVERSITY (United States)

b Scanning Probe Microscope Laboratory Service ^* (United States)

c EGG Idaho Inc (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER AND ALLOYS - VAPOR DEPOSITION; CORROSION; FILMS - BIOFILMS; FILMS - CHARACTERIZATION; SPECTROSCOPY, PHOTOELECTRON;

ATTENUATED TOTAL REFLECTANCE INFRARED SPECTROSCOPY; GERMANIUM SUBSTRATES; MICROBIAL BIOFILMS; OXIDIZED COPPER SURFACES;

COPPER AND ALLOYS;

EID: 0026240718 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.740171104 Document Type: Article

Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.