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Volumn 24, Issue 22, 1991, Pages 5991-5996

Determination of the Concentration Profile at the Surface of d-PS/h-PS Blends Using High-Resolution Ion Scattering Techniques

Author keywords

[No Author keywords available]

Indexed keywords

IONS - SCATTERING; MASS SPECTROMETRY - APPLICATIONS; PHYSICAL CHEMISTRY - MATHEMATICAL MODELS; POLYSTYRENES - SURFACE PROPERTIES; SURFACES - CONCENTRATION;

EID: 0026240663     PISSN: 00249297     EISSN: 15205835     Source Type: Journal    
DOI: 10.1021/ma00022a014     Document Type: Article
Times cited : (87)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.