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Volumn 24, Issue 22, 1991, Pages 5991-5996
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Determination of the Concentration Profile at the Surface of d-PS/h-PS Blends Using High-Resolution Ion Scattering Techniques
a a a a b b d c |
Author keywords
[No Author keywords available]
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Indexed keywords
IONS - SCATTERING;
MASS SPECTROMETRY - APPLICATIONS;
PHYSICAL CHEMISTRY - MATHEMATICAL MODELS;
POLYSTYRENES - SURFACE PROPERTIES;
SURFACES - CONCENTRATION;
BULK MUTUAL DIFFUSION COEFFICIENT;
CONCENTRATION PROFILE;
DEUTERATED POLYSTYRENE;
FORWARD RECOIL ELASTIC SCATTERING;
HYDROGENATED POLYSTYRENE;
PLASTICS BLENDS;
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EID: 0026240663
PISSN: 00249297
EISSN: 15205835
Source Type: Journal
DOI: 10.1021/ma00022a014 Document Type: Article |
Times cited : (87)
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References (17)
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