DYNAMITE: An Efficient Automatic Test Pattern Generation System for Path Delay Faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 10, Issue 10, 1991, Pages 1323-1335

  Fuchs, Karl ^a   Fink, Franz ^a   Schulz, Michael H ^b  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC CIRCUITS--COMPUTER AIDED DESIGN;

DYNAMITE; GRID-GENERATION TECHNIQUES; HIGH-SPEED LOGIC CIRCUITS; TEST PATTERN GENERATION SYSTEMS;

INTEGRATED CIRCUITS, VLSI;

EID: 0026238696     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.88928     Document Type: Article

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