메뉴 건너뛰기




Volumn 10, Issue 10, 1991, Pages 1295-1302

Simplified Simulations of GaAs MESFET's with Semi-Insulating Substrate Compensated by Deep Levels

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0026238426     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.88925     Document Type: Article
Times cited : (8)

References (31)
  • 1
    • 0017982108 scopus 로고
    • Deep trapping effects at the GaAs-GaAs: Cr interface in GaAs FET structures
    • Y. M. Houng and G. L. Pearson, “Deep trapping effects at the GaAs-GaAs: Cr interface in GaAs FET structures,” J. Appl. Phys., vol. 49, pp. 3348–3352, 1978.
    • (1978) J. Appl. Phys. , vol.49 , pp. 3348-3352
    • Houng, Y.M.1    Pearson, G.L.2
  • 2
    • 0019024344 scopus 로고
    • Stability of performance and interfacial problems in GaAs MESFET’s
    • T. Itoh and H. Yanai, “Stability of performance and interfacial problems in GaAs MESFET’s,” IEEE Trans. Electron Devices, vol. ED-27, pp. 1037–1045, 1980.
    • (1980) IEEE Trans. Electron Devices , vol.ED-27 , pp. 1037-1045
    • Itoh, T.1    Yanai, H.2
  • 3
    • 0022029356 scopus 로고
    • The roles of the surface and bulk of the semi-insulating substrate in low-frequency anomalies of GaAs integrated circuits
    • S. Makram-Ebeid and P. Minondo, “The roles of the surface and bulk of the semi-insulating substrate in low-frequency anomalies of GaAs integrated circuits,” IEEE Trans. Electron Devices, vol. ED-32, pp. 632–642, 1985.
    • (1985) IEEE Trans. Electron Devices , vol.ED-32 , pp. 632-642
    • Makram-Ebeid, S.1    Minondo, P.2
  • 4
    • 0023349154 scopus 로고
    • GaAs MESFET interface considerations
    • J. F. Wager and A. J. McCament, “GaAs MESFET interface considerations,” IEEE Trans. Electron Devices, vol. ED-34, pp. 1001-1007, 1987.
    • (1987) IEEE Trans. Electron Devices , vol.ED-34 , pp. 1001-1007
    • Wager, J.F.1    McCament, A.J.2
  • 6
    • 0022786260 scopus 로고
    • Computer-aided analysis of GaAs n-i-n structures with a heavily compensated i-layer
    • K. Horio. T. Ikoma, and H. Yanai, “Computer-aided analysis of GaAs n-i-n structures with a heavily compensated i-layer,” IEEE Trans. Electron Devices, vol. ED-33, pp. 1242–1250, 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 1242-1250
    • Horio, K.1    Ikoma, T.2    Yanai, H.3
  • 7
    • 0020153007 scopus 로고
    • The effect of backgating on the design and performance of GaAs digital integrated circuits
    • M. S. Birrittella, W. C. Seelbach, and H. Goronkin, “The effect of backgating on the design and performance of GaAs digital integrated circuits,” IEEE Trans. Electron Devices, vol. ED-29, pp. 1135–1142, 1982.
    • (1982) IEEE Trans. Electron Devices , vol.ED-29 , pp. 1135-1142
    • Birrittella, M.S.1    Seelbach, W.C.2    Goronkin, H.3
  • 8
    • 0024732877 scopus 로고
    • Reduction of sidegating in GaAs analog and digital circuits using a new buffer layer
    • C.-L. Chen, F. W. Smith, A. R. Calawa, L. J. Mahoney, and M. J. Manfra, “Reduction of sidegating in GaAs analog and digital circuits using a new buffer layer,” IEEE Trans. Electron Devices, vol. 36, pp. 1546–1556, 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 1546-1556
    • Chen, C.-L.1    Smith, F.W.2    Calawa, A.R.3    Mahoney, L.J.4    Manfra, M.J.5
  • 9
    • 0022151725 scopus 로고
    • Buried p-layer SAINT for very high-speed GaAs LSI's with submicrometer gate length
    • K. Yamasaki, N. Kato and M. Hirayama, “Buried p-layer SAINT for very high-speed GaAs LSI's with submicrometer gate length,” IEEE Trans. Electron Devices, vol. ED-32, pp. 2420–2425, 1985.
    • (1985) IEEE Trans. Electron Devices , vol.ED-32 , pp. 2420-2425
    • Yamasaki, K.1    Kato, N.2    Hirayama, M.3
  • 11
    • 0022906261 scopus 로고
    • The use of computer aids in IC technology evolution
    • R. W. Dutton and M. R. Pinto, “The use of computer aids in IC technology evolution,” Proc. IEEE, vol. 74, pp. 1730–1740, 1986.
    • (1986) Proc. IEEE , vol.74 , pp. 1730-1740
    • Dutton, R.W.1    Pinto, M.R.2
  • 12
    • 0017242029 scopus 로고
    • Two-dimensional numerical analysis of stability criteria of GaAs FET’s
    • K. Yamaguchi, S. Asai, and H. Kodera, “Two-dimensional numerical analysis of stability criteria of GaAs FET’s,” IEEE Trans. Electron Devices, vol. ED-23, pp. 1283–1290, 1976.
    • (1976) IEEE Trans. Electron Devices , vol.ED-23 , pp. 1283-1290
    • Yamaguchi, K.1    Asai, S.2    Kodera, H.3
  • 13
    • 0018454997 scopus 로고
    • Physical basis of short-channel MESFET operation
    • T. Wada and J. Frey, “Physical basis of short-channel MESFET operation,” IEEE Trans. Electron Devices, vol. ED-26, pp. 476–490, 1979.
    • (1979) IEEE Trans. Electron Devices , vol.ED-26 , pp. 476-490
    • Wada, T.1    Frey, J.2
  • 14
    • 0020141359 scopus 로고
    • Two-dimensional numerical simulation of energy transport effects in Si and GaAs MESFET’s
    • R. K. Cook and J. Frey, “Two-dimensional numerical simulation of energy transport effects in Si and GaAs MESFET’s,” IEEE Trans. Electron Devices, vol. ED-39, pp. 970–976, 1982.
    • (1982) IEEE Trans. Electron Devices , vol.ED-39 , pp. 970-976
    • Cook, R.K.1    Frey, J.2
  • 15
    • 0020832797 scopus 로고
    • Accurate modeling for submicronmeter-gate Si and GaAs MESFET's using two-dimensional particle simulation
    • A. Yoshii, M. Tomizawa, and K. Yokoyama, “Accurate modeling for submicronmeter-gate Si and GaAs MESFET's using two-dimensional particle simulation,” IEEE Trans. Electron Devices, vol. ED-30, pp. 1376–1380, 1983.
    • (1983) IEEE Trans. Electron Devices , vol.ED-30 , pp. 1376-1380
    • Yoshii, A.1    Tomizawa, M.2    Yokoyama, K.3
  • 16
    • 0020918491 scopus 로고
    • The performance of submicrometer gate length GaAs MESFET’s
    • W. R. Curtice, “The performance of submicrometer gate length GaAs MESFET’s,” IEEE Trans. Electron Devices, vol. ED-30, pp. 1693–1699, 1983.
    • (1983) IEEE Trans. Electron Devices , vol.ED-30 , pp. 1693-1699
    • Curtice, W.R.1
  • 17
    • 0023294219 scopus 로고
    • Two-dimensional hot-electron models for short-gate-length GaAs MESFET’s
    • C. M. Snowden and D. Loret, “Two-dimensional hot-electron models for short-gate-length GaAs MESFET’s,” IEEE Trans. Electron Devices, vol. ED-34, pp. 212–223, 1987.
    • (1987) IEEE Trans. Electron Devices , vol.ED-34 , pp. 212-223
    • Snowden, C.M.1    Loret, D.2
  • 18
    • 0024107421 scopus 로고
    • Drain avalanche breakdown in gallium arsenide MESFET’s
    • Y. Wada and M. Tomizawa, “Drain avalanche breakdown in gallium arsenide MESFET’s,” IEEE Trans. Electron Devices, vol. 35, pp. 1765–1770, 1988.
    • (1988) IEEE Trans. Electron Devices , vol.35 , pp. 1765-1770
    • Wada, Y.1    Tomizawa, M.2
  • 19
    • 0022757115 scopus 로고
    • A comparative analysis of GaAs and Si ion-implanted MESFET’s
    • M. F. Absaid and J. R. Hauser, “A comparative analysis of GaAs and Si ion-implanted MESFET’s,” IEEE Trans. Electron Devices, vol. ED-33, pp. 908–912, 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 908-912
    • Absaid, M.F.1    Hauser, J.R.2
  • 20
    • 0024105622 scopus 로고
    • Numerical simulation of GaAs MESFET's on the semi-insulating substrate compensated by deep traps
    • K. Horio, H. Yanai, and T. Ikoma, “Numerical simulation of GaAs MESFET's on the semi-insulating substrate compensated by deep traps,” IEEE Trans. Electron Devices, vol. 35, pp. 1778–1785, 1988.
    • (1988) IEEE Trans. Electron Devices , vol.35 , pp. 1778-1785
    • Horio, K.1    Yanai, H.2    Ikoma, T.3
  • 21
    • 0024646347 scopus 로고
    • Modeling deep-level trap effects in GaAs MESFET’s, ’’
    • I. Son and T. W. Tang, “Modeling deep-level trap effects in GaAs MESFET’s,’’ IEEE Trans. Electron Devices, vol. 36, pp. 632–640, 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 632-640
    • Son, I.1    Tang, T.W.2
  • 22
    • 84941603721 scopus 로고
    • Numerical analysis of GaAs MESFET's with deep acceptors Cr in the semi-insulating substrate
    • K. Horio, K. Asada, and H. Yanai, “Numerical analysis of GaAs MESFET's with deep acceptors Cr in the semi-insulating substrate,” Trans. IEICE Japan, vol. E72, pp. 603–606, 1989.
    • (1989) Trans. IEICE Japan , vol.E72 , pp. 603-606
    • Horio, K.1    Asada, K.2    Yanai, H.3
  • 23
    • 0024739156 scopus 로고
    • Numerical simulation of GaAs MESFET's with a p-buffer layer on the semi-insulating substrate compensated by deep traps
    • K. Horio, Y. Fuseya, H. Kusuki, and H. Yanai, “Numerical simulation of GaAs MESFET's with a p-buffer layer on the semi-insulating substrate compensated by deep traps,” IEEE Trans. Microwave Theory Tech., vol. 37, pp. 1371–1379, 1989.
    • (1989) IEEE Trans. Microwave Theory Tech. , vol.37 , pp. 1371-1379
    • Horio, K.1    Fuseya, Y.2    Kusuki, H.3    Yanai, H.4
  • 24
    • 0009087888 scopus 로고
    • Compensation mechanism in liquid encapsulated Czochralski GaAs: Importance of melt stoichiometry
    • D. E. Holmes, R. T. Chen, K. R. Elliot, C. G. Kirkpatrick, and P. W. Yu, “Compensation mechanism in liquid encapsulated Czochralski GaAs: Importance of melt stoichiometry,” IEEE Trans. Electron Devices, vol. ED-29, pp. 1045–1051, 1982.
    • (1982) IEEE Trans. Electron Devices , vol.ED-29 , pp. 1045-1051
    • Holmes, D.E.1    Chen, R.T.2    Elliot, K.R.3    Kirkpatrick, C.G.4    Yu, P.W.5
  • 25
    • 33748621800 scopus 로고
    • Statistics of the recombination of holes and electrons
    • W. Shockley and W. T. Read, “Statistics of the recombination of holes and electrons,” Phys. Rev., vol. 87, pp. 835–842, 1952.
    • (1952) Phys. Rev. , vol.87 , pp. 835-842
    • Shockley, W.1    Read, W.T.2
  • 26
    • 0242379070 scopus 로고
    • Electron and hole capture cross-sections at deep centers in gallium arsenide
    • A. Mitonneau, A. Mircea, G. M. Martin, and D. Pons, “Electron and hole capture cross-sections at deep centers in gallium arsenide,” Rev. Phys. Appl., vol. 14, pp. 853–861, 1979.
    • (1979) Rev. Phys. Appl. , vol.14 , pp. 853-861
    • Mitonneau, A.1    Mircea, A.2    Martin, G.M.3    Pons, D.4
  • 27
    • 84916389355 scopus 로고
    • Large-signal analysis of a silicon Read diode oscillator
    • D. L. Scharfetter and H. K. Gummel, “Large-signal analysis of a silicon Read diode oscillator,” IEEE Trans. Electron Devices, vol. ED-16, pp. 64–77, 1969.
    • (1969) IEEE Trans. Electron Devices , vol.ED-16 , pp. 64-77
    • Scharfetter, D.L.1    Gummel, H.K.2
  • 28
    • 84916430884 scopus 로고
    • Self-consistent iterative scheme for one-dimensional steady state transistor calculations
    • H. K. Gummel, “Self-consistent iterative scheme for one-dimensional steady state transistor calculations,” IEEE Trans. Electron Devices, vol. ED-11, pp. 455–465, 1964.
    • (1964) IEEE Trans. Electron Devices , vol.ED-11 , pp. 455-465
    • Gummel, H.K.1
  • 29
    • 84941603378 scopus 로고
    • The Lanczos biorthogonalization algorithm and other oblique projection methods for solving large unsymmetric systems
    • Y. Saad, “The Lanczos biorthogonalization algorithm and other oblique projection methods for solving large unsymmetric systems,” SIAM J. Numer. Anal., vol. 49, pp. 267–285, 1984.
    • (1984) SIAM J. Numer. Anal. , vol.49 , pp. 267-285
    • Saad, Y.1
  • 31
    • 0025238126 scopus 로고
    • MODFET 2-D hydrodynamic energy modeling: Optimization of subquarter-micron-gate structures
    • T. Shawki, G. Salmer, and O. El-Sayed, “MODFET 2-D hydrodynamic energy modeling: Optimization of subquarter-micron-gate structures,” IEEE Trans. Electron Devices, vol. 37, pp. 21–30, 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , pp. 21-30
    • Shawki, T.1    Salmer, G.2    El-Sayed, O.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.