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Volumn 146, Issue 2, 1991, Pages 565-572

The critical rupture thickness of thin water films on hydrophobic surfaces

Author keywords

[No Author keywords available]

Indexed keywords

FILMS - THICKNESS MEASUREMENT; FLOTATION - MATHEMATICAL MODELS; FLUID DYNAMICS; SURFACE ACTIVE AGENTS;

EID: 0026238152     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/0021-9797(91)90220-3     Document Type: Article
Times cited : (55)

References (29)
  • 2
    • 84916182243 scopus 로고    scopus 로고
    • Luttrell, G. H., and Yoon, R. H., Int. J. Miner. Process, in press.
  • 7
    • 84872140994 scopus 로고
    • Department of Mining and Minerals Engineering, Virginia Polytechnic Institute and State University, Blacksburg, Virginia
    • (1986) Ph.D. Thesis
    • Luttrell1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.