Surface breakdown and stability of high-voltage planar junctions

IEEE Transactions on Electron Devices

Volumn 38, Issue 9, 1991, Pages 2181-2188

  Stengl, Reinhard ^a   Falck, Elmar ^b  

^a SIEMENS AG   (Germany)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC FIELDS - SURFACES;

HV JUNCTIONS; P-N JUNCTIONS; PLANAR JUNCTIONS; RESURF DIODES;

SEMICONDUCTOR DIODES;

EID: 0026222514     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.83746     Document Type: Article

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