Physically Realistic Fault Models for Analog CMOS Neural Networks

IEEE Journal of Solid-State Circuits

Volumn 26, Issue 9, 1991, Pages 1223-1229

  Feltham, Derek B I ^a   Maly, Wojciech ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, CMOS - DEFECTS; INTEGRATED CIRCUITS, LINEAR; INTEGRATED CIRCUITS, VLSI - DEFECTS;

ANALOG CMOS; DEFECT SENSITIVITY; FAULT MODELS; VLSI NEURAL NETWORKS;

NEURAL NETWORKS;

EID: 0026220880     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.84938     Document Type: Article

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