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Volumn 113, Issue 3, 1991, Pages 203-215

Piezoresistive stress sensors for structural analysis of electronic packages

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING; SENSORS; STRESSES - ANALYSIS; STRUCTURAL ANALYSIS;

EID: 0026219178     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.2905397     Document Type: Article
Times cited : (207)

References (28)
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    • The Effect of Pressure on the Electrical Resistance of Certain Semi-Conductors
    • Bridgman, P. W., 1951, “The Effect of Pressure on the Electrical Resistance of Certain Semi-Conductors,” Proceedings of the American Academy of Arts and Sciences, Vol. 79, No. 3, pp. 125-179.
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    • Bridgman, P.W.1
  • 13
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    • Use of Piezoresistive Materials in the Measurement of Displacement, Force, and Torque
    • Mason, W. P., and Thurston, R. N., 1957, “Use of Piezoresistive Materials in the Measurement of Displacement, Force, and Torque,” Journal of the Acoustical Society of America, Vol. 29, No. 10, pp. 1096-1101.
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  • 19
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  • 20
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    • Reciprocal Relations in Irreversible Processes—II
    • Onsager, L., 1931b, “Reciprocal Relations in Irreversible Processes—II.,” Physical Review, Vol. 38, pp. 2265-2279.
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  • 21
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    • Pressure Dependence of the Resistivity of Silicon
    • Paul, W, and Pearson, G. L., 1955, “Pressure Dependence of the Resistivity of Silicon,” Physical Review, Vol. 98, No. 6, pp. 1755-1757.
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  • 22
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    • Semiconducting Stress Transducers Using the Transverse and Shear Piezoresistance Effects
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  • 23
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    • Piezoresistance Effect in Silicon and Germanium
    • Smith, C. S., 1954, “Piezoresistance Effect in Silicon and Germanium,” Physical Review, Vol. 94, No. 1, pp. 42-49.
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  • 24
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    • by F. Seitz, and D. Turnbull, Academic Press
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  • 27
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  • 28
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.