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Solid State Electronics

Volumn 34, Issue 8, 1991, Pages 911-916

A model for electromigration and low-frequency noise in thin metal films

(2) Yang, Wiyi a Çelik Butler, Zeynep a

a SOUTHERN METHODIST UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, VLSI;

ELETROMIGRATION;

METALLIC FILMS;

EID: 0026206616 PISSN: 00381101 EISSN: None Source Type: Journal
DOI: 10.1016/0038-1101(91)90239-U Document Type: Article

Times cited : (27)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.