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Volumn 26, Issue 8, 1991, Pages 1116-1122

A New MOS Imager Using Photodiode as Current Source

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS; SEMICONDUCTOR DEVICES, MOS; SEMICONDUCTOR DIODES, PHOTODIODE;

EID: 0026206567     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.90065     Document Type: Article
Times cited : (19)

References (12)
  • 1
    • 0024011917 scopus 로고
    • A new device architecture suitable for high-resolution and high-performance image sensors
    • May
    • J. Hynecek, “A new device architecture suitable for high-resolution and high-performance image sensors,” IEEE Trans. Electron Devices, vol. 35, no. 5, pp. 646–652, May 1988.
    • (1988) IEEE Trans. Electron Devices , vol.35 , Issue.5 , pp. 646-652
    • Hynecek, J.1
  • 3
    • 84941609235 scopus 로고
    • Kohgaku-Tosho Co., Ltd., ch. 5.2.2(in Japanese)
    • H. Yonezu, Optical Communication Device Technology Kohgaku-Tosho Co., Ltd., 1987, ch. 5.2.2, pp. 325–338 (in Japanese).
    • (1987) Optical Communication Device Technology , pp. 325-338
    • Yonezu, H.1
  • 4
    • 0020102616 scopus 로고
    • Interface state trapping and dark current generation in buried-channel CCD
    • N. S. Saks, “Interface state trapping and dark current generation in buried-channel CCD,” J. Appl. Phys., vol. 53, no. 3, pp. 1745–1753, 1982.
    • (1982) J. Appl. Phys. , vol.53 , Issue.3 , pp. 1745-1753
    • Saks, N.S.1
  • 5
    • 0024611917 scopus 로고
    • Design concept for a low-noise CCD image sensor based on subjective evaluation
    • Feb.
    • Y. Nishida, J. Koike, H. Ohtake, M. Abe, and S. Yoshikawa, “Design concept for a low-noise CCD image sensor based on subjective evaluation,” IEEE Trans. Electron Devices, vol. 36, no. 2, pp. 360–366, Feb. 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , Issue.2 , pp. 360-366
    • Nishida, Y.1    Koike, J.2    Ohtake, H.3    Abe, M.4    Yoshikawa, S.5
  • 7
    • 84941603860 scopus 로고
    • High responsible interline CCD with 5 lx for minimum sensitivity
    • Oct.(in Japanese)
    • S. Hamazaki et. al., “High responsible interline CCD with 5 lx for minimum sensitivity,” Nikkei Microdevice, pp. 60–68, Oct. 1987 (in Japanese).
    • (1987) Nikkei Microdevice , pp. 60-68
    • Hamazaki, S.1
  • 8
    • 0016027413 scopus 로고
    • Characteristics of surface channel CCD image arrays at low light levels
    • Feb.
    • M. H. White, D. R. Lampe, F. C. Blaha, and I. A. Mack, “Characteristics of surface channel CCD image arrays at low light levels,” IEEE J. Solid-State Circuits, vol. SC-9, no. 1, pp. 1–13, Feb. 1974.
    • (1974) IEEE J. Solid-State Circuits , vol.SC-9 , Issue.1 , pp. 1-13
    • White, M.H.1    Lampe, D.R.2    Blaha, F.C.3    Mack, I.A.4
  • 9
    • 84941604669 scopus 로고
    • Solid-state imager implementing sensitivity control function on a chip
    • Oct.(in Japanese)
    • I. Takemoto, T. Imada, and H. Akimoto, “Solid-state imager implementing sensitivity control function on a chip,” Nikkei Microdevice, pp. 68–79, Oct. 1987 (in Japanese).
    • (1987) Nikkei Microdevice , pp. 68-79
    • Takemoto, I.1    Imada, T.2    Akimoto, H.3
  • 10
    • 0024480340 scopus 로고
    • A low-noise Bi-CMOS linear image sensor with auto-focusing function
    • Jan.
    • N. Tanaka, T. Ohmi, Y. Nakamura, and S. Matsumoto, “A low-noise Bi-CMOS linear image sensor with auto-focusing function,” IEEE Trans. Electron Devices, vol. 36, no. 1, pp. 39–45, Jan. 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , Issue.1 , pp. 39-45
    • Tanaka, N.1    Ohmi, T.2    Nakamura, Y.3    Matsumoto, S.4
  • 11
    • 0024479936 scopus 로고
    • A novel bipolar imaging device with self-reduction capability
    • Jan.
    • N. Tanaka, T. Ohmi, and Y. Nakamura, “A novel bipolar imaging device with self-reduction capability,” IEEE Trans. Electron Devices, vol. 36, no. 1, pp. 31–38, Jan. 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , Issue.1 , pp. 31-38
    • Tanaka, N.1    Ohmi, T.2    Nakamura, Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.