The Impact of Voltage Scaling on Electron Heating and Device Performance of Submicrometer MOSFET’s

IEEE Transactions on Electron Devices

Volumn 38, Issue 8, 1991, Pages 1895-1904

  Venturi, Franco ^a   Sangiorgi, E ^b   Riccò, Bruno ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b UNIVERSITY OF UDINE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS;

HOT ELECTRONS; SUBMICROMETER MOSFET; VOLTAGE SCALING;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0026204658     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.119031     Document Type: Article

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