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1
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84942738272
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Anritsu America Inc., 15 Thornton Rd, Oakland, New Jersey, 07436; Hewlett-Packard Co., Test & Measurement Catalog, 3200 Hillview Ave., Palo Alto, CA 94304; Hughes Millimeter-Wave Products, P.O. Box 2940, Torrance, CA 90509–2940.
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Anritsu America Inc., 15 Thornton Rd, Oakland, New Jersey, 07436; Hewlett-Packard Co., Test & Measurement Catalog, 3200 Hillview Ave., Palo Alto, CA 94304; Hughes Millimeter-Wave Products, P.O. Box 2940, Torrance, CA 90509–2940.
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2
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0021390306
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Far-infrared microbolometer detectors
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D.P. Neikirk, W.W. Lam, and D.B. Rutledge, “Far-infrared microbolometer detectors,” Int. J. Infrared and Millimeter Waves, vol. 5, pp. 245–476, 1984.
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(1984)
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Neikirk, D.P.1
Lam, W.W.2
Rutledge, D.B.3
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3
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0019584616
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Calibration of power and energy meters for the FIR/near MMW spectral regions
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Foot, Hodges, and Dyson, “Calibration of power and energy meters for the FIR/near MMW spectral regions,” Int. J. of Infrared Millimeter Waves, vol. 5, no. 4, pp. 773–782, 1981.
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(1981)
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Foot, H.1
Dyson2
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4
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84942738091
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Thomas Keating Ltd., Billingshurst, West Sussex, England.
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Thomas Keating Ltd., Billingshurst, West Sussex, England.
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5
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0015680011
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Thin metal-film room-temperature IR bolometers with nanosecond response times
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Nov.
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W.H. Block and O.L. Gaddy, “Thin metal-film room-temperature IR bolometers with nanosecond response times,” IEEE J. Quantum Electron., vol. QE-9, Nov. 1973.
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(1973)
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Block, W.H.1
Gaddy, O.L.2
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6
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0025493811
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Monolithic millimeter-wave two-dimensional horn imaging arrays
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Sept.
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G.M. Rebeiz, D.P. Kasilingam, P.A. Stimson, Y. Guo, and D.B. Rutledge, “Monolithic millimeter-wave two-dimensional horn imaging arrays,” IEEE Trans. Antennas Propagai., vol. 38, Sept. 1990.
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(1990)
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Rebeiz, G.M.1
Kasilingam, D.P.2
Stimson, P.A.3
Guo, Y.4
Rutledge, D.B.5
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8
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0020127035
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Silicon as a mechanical material
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K.E. Peterson, “Silicon as a mechanical material,” Proc. IEEE, vol. 70, pp. 420–457, 1982.
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(1982)
Proc. IEEE
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Peterson, K.E.1
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10
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0024174397
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A dielectrically-supported multi-element mass flow sensor
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Dec.
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E. Yoon and K.D. Wise, “A dielectrically-supported multi-element mass flow sensor,” in Proc. IEDM-88 (San Francisco), Dec. 1988.
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(1988)
Proc. IEDM-88 (San Francisco)
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Yoon, E.1
Wise, K.D.2
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11
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0023450672
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Measuring and modeling the backscattering cross section of a leaf
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Nov.
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T.B.A. Senior, K. Sarabandi, and F.T. Ulaby, “Measuring and modeling the backscattering cross section of a leaf,” Radio Sci., vol. 22, pp. 1109–1116, Nov. 1987.
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(1987)
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Senior, T.B.A.1
Sarabandi, K.2
Ulaby, F.T.3
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12
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84942737840
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Thin-film power-density meter for millimeter wavelengths
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submitted to
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K.A. Lee, Y. Guo, P.A. Stimpson, K.A. Potter, and D.B. Rutledge, “Thin-film power-density meter for millimeter wavelengths,” submitted to IEEE Trans. Antennas Propagai.
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IEEE Trans. Antennas Propagai.
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Lee, K.A.1
Guo, Y.2
Stimpson, P.A.3
Potter, K.A.4
Rutledge, D.B.5
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