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Volumn 12, Issue 8, 1991, Pages 447-449

High-Mobility Modulation-Doped Graded Sige-Channel P-Mosfet's

Author keywords

[No Author keywords available]

Indexed keywords

BORON - APPLICATIONS; SEMICONDUCTING GERMANIUM COMPOUNDS - APPLICATIONS; SEMICONDUCTING SILICON COMPOUNDS - APPLICATIONS;

EID: 0026204002     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/55.119161     Document Type: Article
Times cited : (107)

References (9)
  • 3
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    • Carrier confinement in MOS-gated GexSi1-x/Si heterostructures
    • P. M. Garone, V. Venkataraman, and J. C. Sturm, “Carrier confinement in MOS-gated GexSi1-x/Si heterostructures,” in IEDM Tech. Dig., 1990, pp. 383–387.
    • (1990) IEDM Tech. Dig. , pp. 383-387
    • Garone, P.M.1    Venkataraman, V.2    Sturm, J.C.3
  • 4
    • 0025577835 scopus 로고
    • Ultra high hole mobility in strain-controlled Si-Ge modulation doped FET
    • E. Murakami, K. Nakagawa, A. Nishida, and M. Miyao, “Ultra high hole mobility in strain-controlled Si-Ge modulation doped FET,” in IEDM Tech. Dig., 1990, pp. 375–379.
    • (1990) IEDM Tech. Dig. , pp. 375-379
    • Murakami, E.1    Nakagawa, K.2    Nishida, A.3    Miyao, M.4
  • 5
    • 0026390473 scopus 로고
    • Graded SiGe-channel modulation-doped p-MOSFET's
    • S. Verdonckt-Vandebroek et al., “Graded SiGe-channel modulation-doped p-MOSFET's,” in VLSI Tech. Symp. Dig., 1991, pp. 105–106.
    • (1991) VLSI Tech. Symp. Dig. , pp. 105-106
    • Verdonckt-Vandebroek, S.1
  • 6
    • 5844399719 scopus 로고
    • Low-temperature silicon epitaxy by ultrahigh vacuum/chemical vapor deposition
    • B. S. Meyerson, “Low-temperature silicon epitaxy by ultrahigh vacuum/chemical vapor deposition,” Appl. Phys. Lett., vol. 48, pp. 797–799, 1986.
    • (1986) Appl. Phys. Lett. , vol.48 , pp. 797-799
    • Meyerson, B.S.1
  • 7
    • 0020186076 scopus 로고
    • Charge accumulation and mobility in thin dielectric MOS transistors
    • C. G. Sodini, T. W. Ekstedt, and J. W. Moll, “Charge accumulation and mobility in thin dielectric MOS transistors,” Solid-State Electron., vol. 25, pp. 833–841, 1982.
    • (1982) Solid-State Electron. , vol.25 , pp. 833-841
    • Sodini, C.G.1    Ekstedt, T.W.2    Moll, J.W.3
  • 9
    • 0002220227 scopus 로고
    • High hole mobility in Si/Si1_xGex/Si p-type modulation-doped double heterostructures
    • P. J. Wang, B. S. Meyerson, F. F. Fang, J. Nocera, and B. Parker, “High hole mobility in Si/Si1_xGex/Si p-type modulation-doped double heterostructures,” Appl. Phys. Lett., vol. 55, pp. 2333–2335, 1989.
    • (1989) Appl. Phys. Lett. , vol.55 , pp. 2333-2335
    • Wang, P.J.1    Meyerson, B.S.2    Fang, F.F.3    Nocera, J.4    Parker, B.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.