Experimental Analysis of Transmission Line Parameters in High-Speed Gaas Digital Circuit Interconnects

IEEE Transactions on Microwave Theory and Techniques

Volumn 39, Issue 8, 1991, Pages 1361-1367

  Kiziloglu, Kiirsad ^a   Dagli, Nadir ^a   Matthaei, George L ^a   Long, Stephen I ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASUREMENTS--CAPACITANCE; ELECTRIC MEASUREMENTS--RESISTANCE; ELECTRIC NETWORKS--MATHEMATICAL MODELS; ELECTRONIC CIRCUITS, DIGITAL--ELECTRONICS PACKAGING; SEMICONDUCTING GALLIUM ARSENIDE--APPLICATIONS;

COPLANAR STRIPS; HIGH SPEED GALLIUM ARSENIDE DIGITAL CIRCUIT INTERCONNECTS; INTERCONNECT QUASI-TEM PROPERTIES; LINE PARAMETERS;

ELECTRIC NETWORKS;

EID: 0026202487     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.85411     Document Type: Article

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