Analysis of Negative Differential Resistance in the I-V Characteristics of Shorted-Anode LIGBT’s

IEEE Transactions on Electron Devices

Volumn 38, Issue 7, 1991, Pages 1633-1640

  Simpson, Mark R ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

INDUSTRIAL ELECTRONICS--COMPONENTS; PHYSICS--SOLID STATE;

CURRENT VOLTAGE CHARACTERISTICS; LATERAL INSULATED GATE BIPOLAR TRANSISTOR; NEGATIVE DIFFERENTIAL RESISTANCE; POWER IC;

TRANSISTORS, BIPOLAR;

EID: 0026191280     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.85160     Document Type: Article

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