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Volumn 6, Issue 3, 1991, Pages 1088-1095

Capacitance switching with vacuum circuit breakers - a comparative evaluation

Author keywords

[No Author keywords available]

Indexed keywords

STATISTICAL METHODS;

EID: 0026188762     PISSN: 08858977     EISSN: 19374208     Source Type: Journal    
DOI: 10.1109/61.85852     Document Type: Article
Times cited : (20)

References (9)
  • 1
    • 49249126729 scopus 로고
    • Some Fundamentals on Capacitance Switching
    • I. B. Johnson, A. J. Schultz, N. R. Schultz and R. B. Shores, “Some Fundamentals on Capacitance Switching,” Trans. AIEE, Vol. 74, Part III, pp. 727–736, 1955.
    • (1955) Trans. AIEE , vol.74 , pp. 727-736
    • Johnson, I.B.1    Schultz, A.J.2    Schultz, N.R.3    Shores, R.B.4
  • 4
    • 0025508775 scopus 로고
    • A Synthetic Test Method for Evaluating the Shunt Capacitor Switching Performance of Vacuum Circuit Breakers,” presented at the
    • Atlanta, GA, Feb. 4-8
    • T. Ohshima, K. Yokokura, M. Matsuda, Y. Kanai, K. Satoh and S. Yanabu, “A Synthetic Test Method for Evaluating the Shunt Capacitor Switching Performance of Vacuum Circuit Breakers,” presented at the IEEE Winter Power Meeting(90 WM186-7PWRD), Atlanta, GA, Feb. 4-8, 1990.
    • (1990) IEEE Winter Power Meeting(90 WM186-7PWRD)
    • Ohshima, T.1    Yokokura, K.2    Matsuda, M.3    Kanai, Y.4    Satoh, K.5    Yanabu, S.6
  • 5
    • 84890368281 scopus 로고
    • Experimental Investigation of Dielectric Recovery Strength between the Separating Contacts of Vacuum Circuit Breakers
    • A. T. Roguski, “Experimental Investigation of Dielectric Recovery Strength between the Separating Contacts of Vacuum Circuit Breakers,” Trans. IEEE, Vol. PD-4, pp. 1063–1069, 1989.
    • (1989) Trans. IEEE , vol.PD-4 , pp. 1063-1069
    • Roguski, A.T.1
  • 6
    • 0018294027 scopus 로고
    • Statistical Properties of the Breakdown of Vacuum Circuit Breakers and its Influence on the Surge Generation in Capacitance and Reactive Current Interruption
    • Y. Murai, H. Toya and T. Nitta, “Statistical Properties of the Breakdown of Vacuum Circuit Breakers and its Influence on the Surge Generation in Capacitance and Reactive Current Interruption,” Trans. IEEE, Vol. PAS-98, pp. 232–238, 1979.
    • (1979) Trans. IEEE , vol.PAS-98 , pp. 232-238
    • Murai, Y.1    Toya, H.2    Nitta, T.3
  • 7
    • 0019557101 scopus 로고
    • Statistical Property of Breakdown between metal Electrodes in Vacuum
    • H. Toya, N. Ueno, T. Okada and Y. Murai, “Statistical Property of Breakdown between metal Electrodes in Vacuum,” Trans. IEEE, Vol. PAS-100, pp. 1932–1939, 1981.
    • (1981) Trans. IEEE , vol.PAS-100 , pp. 1932-1939
    • Toya, H.1    Ueno, N.2    Okada, T.3    Murai, Y.4
  • 8
    • 84947656374 scopus 로고
    • Applicability of Simple Expressions for the Law of Breakdown Probability Increase to Electrical Breakdown in Vacuum
    • June
    • P. Osmokrovic and G. Djogo, “Applicability of Simple Expressions for the Law of Breakdown Probability Increase to Electrical Breakdown in Vacuum,” Proc. XIII Symp. on Discharges and Electrical Insulation in Vacuum, Vol. 1, pp. 109–111, June 1988.
    • (1988) Proc. XIII Symp. on Discharges and Electrical Insulation in Vacuum , vol.1 , pp. 109-111
    • Osmokrovic, P.1    Djogo, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.