ATPG based on a novel grid-addressable latch element

Proceedings - Design Automation Conference

Volumn , Issue , 1991, Pages 282-286

  Chandra, Susheel J ^a   Ferry, Tom ^a   Gheewala, Tushar ^a   Pierce, Kerry ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, DIGITAL--TESTING;

BUILT-IN SELF TEST; DESIGN FOR TESTABILITY;

LOGIC CIRCUITS, SEQUENTIAL;

EID: 0026175482     PISSN: 01467123     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/127601.127681     Document Type: Conference Paper

References (13)